Optical High-Precision Film Thickness Gauge
The optical high-precision film thickness gauge independently developed by the company uses the principle of light interference for non-contact measurement of film layers. It can measure transparent and semi-transparent coated film layers. The measurable thickness reaches nanometer level, with a maximum measurement accuracy of 0.5%. The gauge features ultra-high precision, simple operation, and a wide range of application scenarios.
Technical Specifications
| Item/Model | Model 1 | Model 2 | Model 3 |
| Measurement Method | VIS, R | UV, VIS, R | IR, R |
| Wavelength Range | 380nm-1050nm | 250nm-1050nm | 900nm-1200nm |
| Thickness Range | 15nm-100μm | 2nm-200μm | 200nm-3000μm |
| Light Source | Tungsten Halogen Lamp | Tungsten Halogen Lamp + Deuterium Lamp | Tungsten Halogen Lamp |
| Repeatability Precision | 0.1nm | ||
| Accuracy | 2nm or 0.5% | ||
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